English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Poster

Surface enhanced Raman spectroscopy and Scanning Kelvin Probe studies of corrosive de-adhesion at polymer-metal interfaces

MPS-Authors
/persons/resource/persons125362

Santa,  M.
Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125321

Posner,  R.
Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125161

Grundmeier,  G.
Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Santa, M., Posner, R., & Grundmeier, G. (2008). Surface enhanced Raman spectroscopy and Scanning Kelvin Probe studies of corrosive de-adhesion at polymer-metal interfaces. Poster presented at The 59th Annual Meeting of the International Society of Electrochemistry, Seville, Spain.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-467F-4
Abstract
There is no abstract available