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Effects of the Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Metal Interface

MPS-Authors
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Salgin,  B.
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125346

Rohwerder,  M.
Christian Doppler Laboratory for Diffusion and Segregation Mechanisms, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Salgin, B., & Rohwerder, M. (2008). Effects of the Semiconducting Properties of Surface Oxide on the Delamination at the Polymer/Metal Interface. Poster presented at 2nd International IMPRS-SurMat Workshop, Bochum, Germany.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-4802-A
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