Distinction of different Laves phase types by EBSD in a TiCr diffusion couple: 
Robust detection of subtle differences in EBSD patterns

Zaefferer, Stefan; Ishikawa, Shigehiro; Stein, Frank

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Poster

Distinction of different Laves phase types by EBSD in a TiCr diffusion couple: Robust detection of subtle differences in EBSD patterns

MPS-Authors

/persons/resource/persons125491

Zaefferer, Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125192

Ishikawa, Shigehiro
Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125402

Stein, Frank
Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Zaefferer, S., Ishikawa, S., & Stein, F. (2008). Distinction of different Laves phase types by EBSD in a TiCr diffusion couple: Robust detection of subtle differences in EBSD patterns. Poster presented at Electron Backscatter Diffraction Meeting, RMS Conference, Sheffield, UK.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-4AA1-3

Abstract

There is no abstract available