3D orientation microscopy by combined FIB-serial sectioning EBSD-based 
orientation microscopy: Principles and applications

Zaefferer, S.

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3D orientation microscopy by combined FIB-serial sectioning EBSD-based orientation microscopy: Principles and applications

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Zaefferer, S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2007). 3D orientation microscopy by combined FIB-serial sectioning EBSD-based orientation microscopy: Principles and applications. Talk presented at FEMMS 2007. Sonoma, USA. 2007-09-25.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-4FDE-2

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