3D-orientation microscopy in a FIB SEM: A new dimension of microstructure 
characterisation

Zaefferer, S.

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3D-orientation microscopy in a FIB SEM: A new dimension of microstructure characterisation

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Zaefferer, S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S. (2007). 3D-orientation microscopy in a FIB SEM: A new dimension of microstructure characterisation. Talk presented at EUROMAT 2007. Nürnberg, Germany. 2007-09-10.

Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-50F9-E

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