Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM 
imaging techniques

Kelm, Klemens; Irsen, Stephan H.; Quandt, Eckhard; Paninski, M.; Drevermann, Anne; Schmitz, Georg J.; Palm, Martin; Stein, Frank; Heilmaier, Martin; Engberding, Nico; Saage, Holger; Sturm, Daniel

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Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM imaging techniques

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Palm, Martin
Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stein, Frank
Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Engberding, Nico
Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kelm, K., Irsen, S. H., Quandt, E., Paninski, M., Drevermann, A., Schmitz, G. J., et al. (2007). Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM imaging techniques. Talk presented at 33rd Conference of the DGE Deutsche Gesellschaft für Elektronenmikroskopie e.V. Saarbrücken, Germany. 2007-09-02 - 2007-09-07.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-5177-8

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