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Characterization of the microstructure of Al-rich TiAl alloys by combined TEM imaging techniques

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Palm,  Martin
Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stein,  Frank
Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Engberding,  Nico
Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kelm, K., Irsen, S. H., Paninski, M., Drevermann, A., Schmitz, G. J., Palm, M., et al. (2007). Characterization of the microstructure of Al-rich TiAl alloys by combined TEM imaging techniques. Microscopy and Microanalysis, 13(3), 294-295.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-55A8-F
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