Rohwerder, Michael Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Rohwerder, M. (2006). High Resolution Kelvin Probe Microscopy: Scanning Kelvin Probe Force Microscopy (SKPFM) vs. classical Scanning Kelvin Probe (SKP). Talk presented at 6th international symposium: Electrochemical Micro- and Nanosystem Technologies (EMNT 2006). Bonn, Germany. 2006-08-22 - 2006-08-25.