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High Resolution Kelvin Probe Microscopy: Scanning Kelvin Probe Force Microscopy (SKPFM) vs. classical Scanning Kelvin Probe (SKP)

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Rohwerder,  Michael
Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Rohwerder, M. (2006). High Resolution Kelvin Probe Microscopy: Scanning Kelvin Probe Force Microscopy (SKPFM) vs. classical Scanning Kelvin Probe (SKP). Talk presented at 6th international symposium: Electrochemical Micro- and Nanosystem Technologies (EMNT 2006). Bonn, Germany. 2006-08-22 - 2006-08-25.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-5876-7
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