English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Talk

3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure characterization

MPS-Authors
/persons/resource/persons125491

Zaefferer,  S.
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Zaefferer, S. (2006). 3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure characterization. Talk presented at 13th Conference on Electron Backscatter Diffraction. Oxford, UK. 2006-04-04.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-5A10-C
Abstract
There is no abstract available