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Conference Paper

Quantitative EDX analysis of Bi2Te3 in the TEM

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Peranio, N., & Eibl, O. (2005). Quantitative EDX analysis of Bi2Te3 in the TEM. In ICT2004. Piscataway, NJ, USA: IEEE.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-62E7-9
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