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Conference Paper

Structural analysis of Bi2Te3 superlattices epitaxially grown on BaF2 by transmission electron microscopy

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Peranio, N., Eibl, O., & Nurnus, J. (2005). Structural analysis of Bi2Te3 superlattices epitaxially grown on BaF2 by transmission electron microscopy. In ICT2004. Piscataway, NJ, USA: IEEE.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-62EB-1
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