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Introduction of a height regulated Scanning Kelvin Probe for the simultaneous measurement of surface topography and interfacial electrode potentials in corrosive environments

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Grundmeier,  G.
Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Wapner,  K.
Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schönberger,  B.
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stratmann,  M.
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Grundmeier, G., Wapner, K., Schönberger, B., & Stratmann, M. (2004). Introduction of a height regulated Scanning Kelvin Probe for the simultaneous measurement of surface topography and interfacial electrode potentials in corrosive environments. Talk presented at ISE Conference, 55th Annual Meeting. Thessaloniki, Greece. 2004-09-19 - 2004-09-24.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-640F-0
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