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Controlling Film Properties in Microstructures on Single Grains of Titanium; A SDC, SECM and Imaging Ellipsometry Study

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Hassel,  A. W.
Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125147

Fushimi,  K.
Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125406

Stratmann,  M.
Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Hassel, A. W., Fushimi, K., Stratmann, M., & Seo, M. (2003). Controlling Film Properties in Microstructures on Single Grains of Titanium; A SDC, SECM and Imaging Ellipsometry Study. Talk presented at 54rd Annual Meeting of the International Society of Electrochemistry. Sao Pedro, Brazil. 2003-08-31 - 2003-09-05.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-69FF-E
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