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Trapping of transient processes in aluminium oxide thin films in a voltage pulse experiment

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Hassel,  A. W.
Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Hassel, A. W., & Diesing, D. (2002). Trapping of transient processes in aluminium oxide thin films in a voltage pulse experiment. Electrochemistry Communications, 4, 1-4.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-6F07-6
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