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The Scanning Kelvinprobe; a new technique for the in situ analysis of the delamination of organic coatings

MPS-Authors
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Stratmann,  M.
Physical Chemistry, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Leng,  A.
Physical Chemistry, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Streckel,  H.
Physical Chemistry, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stratmann, M., Leng, A., Fürbeth, W., Streckel, H., Gehmecker, H., & Große-Brinkhaus, K. H. (1996). The Scanning Kelvinprobe; a new technique for the in situ analysis of the delamination of organic coatings. Prog. Org. Coat., 27: 1-4, pp. 573-588.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-73B3-3
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