The Scanning Kelvinprobe; a new technique for the in situ analysis of the 
delamination of organic coatings

Stratmann, M.; Leng, A.; Fürbeth, W.; Streckel, H.; Gehmecker, H.; Große-Brinkhaus, K. H.

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The Scanning Kelvinprobe; a new technique for the in situ analysis of the delamination of organic coatings

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Stratmann, M.
Physical Chemistry, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Leng, A.
Physical Chemistry, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Streckel, H.
Physical Chemistry, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stratmann, M., Leng, A., Fürbeth, W., Streckel, H., Gehmecker, H., & Große-Brinkhaus, K. H. (1996). The Scanning Kelvinprobe; a new technique for the in situ analysis of the delamination of organic coatings. Prog. Org. Coat., 27: 1-4, pp. 573-588.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-73B3-3

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