Spectroscopy of Stripe Order in La1.8Sr0.2NiO4 Using Resonant Soft X-Ray 
Diffraction

Schüßler-Langeheine, C.; Schlappa, J.; Tanaka, A.; Hu, Z.; Chang, C. F.; Schierle, E.; Benomar, M.; Ott, H.; Weschke, E.; Kaindl, G.; Friedt, O.; Sawatzky, G. A.; Lin, H.-J.; Chen, C. T.; Braden, M.; Tjeng, L. H.

doi:10.1103/PhysRevLett.95.156402

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Spectroscopy of Stripe Order in La_1.8Sr_0.2NiO₄ Using Resonant Soft X-Ray Diffraction

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Citation

Schüßler-Langeheine, C., Schlappa, J., Tanaka, A., Hu, Z., Chang, C. F., Schierle, E., et al. (2005). Spectroscopy of Stripe Order in La_1.8Sr_0.2NiO₄ Using Resonant Soft X-Ray Diffraction. Physical Review Letters, 95(15): 156402, pp. 1-4. doi:10.1103/PhysRevLett.95.156402.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-17E8-1

Abstract

Strong resonant enhancements of the charge-order and spin-order superstructure-diffraction intensities in La1.8Sr0.2NiO4 are observed when x-ray energies in the vicinity of the Ni L-2,L-3 absorption edges are used. The pronounced photon-energy and polarization dependences of these diffraction intensities allow for a critical determination of the local symmetry of the ordered spin and charge carriers. We found that not only the antiferromagnetic order but also the charge-order superstructure resides within the NiO2 layers; the holes are mainly located on in-plane oxygens surrounding a Ni2+ site with the spins coupled antiparallel in close analogy to Zhang-Rice singlets in the cuprates.