Core-level x-ray photoemission on NiO in the impurity limit

Altieri, S.; Tjeng, L. H.; Tanaka, A.; Sawatzky, G. A.

doi:10.1103/PhysRevB.61.13403

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Core-level x-ray photoemission on NiO in the impurity limit

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Altieri, S., Tjeng, L. H., Tanaka, A., & Sawatzky, G. A. (2000). Core-level x-ray photoemission on NiO in the impurity limit. Physical Review B, 61(20), 13403-13409. doi:10.1103/PhysRevB.61.13403.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-1DD8-A

Abstract

We present a core level X-ray photoelectron spectroscopy study of Ni(x)Mg(1 - x)O crystals with 0.03<x<1. We show that nonlocal effects involving inter-Ni-site fluctuations strongly influence the Ni 2p core-level spectra for higher Ni concentrations including NiO itself. It is only in the very dilute Ni limit that the core-level spectra can be described in terms of an Anderson impurity model which also must include a realistic band structure for the O 2p. Moreover, it is only in this limit that a single-sire model can explain the core-level and valence-band spectra as well as the optical data by using one consistent set of parameter values. These results consolidate the concepts of nonlocal screening and provide a better understanding of the electronic structure of NiO.