Reduction of Coulomb and charge-transfer energies in oxide films on metals

Altieri, S.; Tjeng, L. H.; Voogt, F. C.; Hibma, A.; Sawatzky, G. A.

doi:10.1103/PhysRevB.59.R2517

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Reduction of Coulomb and charge-transfer energies in oxide films on metals

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Altieri, S., Tjeng, L. H., Voogt, F. C., Hibma, A., & Sawatzky, G. A. (1999). Reduction of Coulomb and charge-transfer energies in oxide films on metals. Physical Review B, 59(4), R2517-R2520. doi:10.1103/PhysRevB.59.R2517.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-1DCA-A

Abstract

Using the MgO/Ag(100) interface as a model system, we demonstrate that Coulomb and charge-transfer energies in oxide layers deposited on a highly polarizable medium like a metal, are reduced from their bulk values, by as much as 1.8 eV and 2.5 eV, respectively. The use of efficient image potential screening may provide a new method to alter various transition temperatures and properties of correlated oxides. [S0163-1829(99)51504-X].