EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films 
Deposited on MgO Substrates

Rashkova, Boryana; Zhang, Zaoli; Šturm, Sašo; Kothleitner, Gerald; Kutschej, Kerstin; Mitterer, Christian; Lazar, Petr; Redinger, Josef; Podloucky, Raimund; Scheu, Christina; Dehm, Gerhard

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EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates

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Rashkova, B., Zhang, Z., Šturm, S., Kothleitner, G., Kutschej, K., Mitterer, C., et al. (2009). EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In G. Kothleitner (Ed.), 9th Multinational Microscopy Conference 2009 (pp. 285-286). Graz, Austria: Verlag der Technischen Universität Graz.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-5556-F

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