Size effect in metallic thin films characterized by low-temperature X-ray 
diffraction

Eiper, Ernst; Martinschitz, Klaus J.; Dehm, Gerhard; Kečkéš, Jozef

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Size effect in metallic thin films characterized by low-temperature X-ray diffraction

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Eiper, E., Martinschitz, K. J., Dehm, G., & Kečkéš, J. (2006). Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Poster presented at Gordon Research Conference on thin film & smallscale mechanical behavior, Colby College Waterville, Maine, USA.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-4E11-D

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