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Conference Paper

In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism

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Oh,  Sang Ho
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gruber,  Patric Alfons
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  Eduard
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Oh, S. H., Kiener, D., Legros, M., Gruber, P. A., Arzt, E., & Dehm, G. (2006). In-situ TEM tensile testing of thin Au films: A transition in deformation mechanism.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0024-51BE-7
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