Crystal rotation in Cu single crystal micropillars: In situ Laue and electron 
backscatter diffraction

Maaß, Robert; Van Petegem, Steven V.; Grolimund, Daniel; Van Swygenhoven, Helena; Kiener, Daniel; Dehm, Gerhard

doi:10.1063/1.2884688

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Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction

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Citation

Maaß, R., Van Petegem, S. V., Grolimund, D., Van Swygenhoven, H., Kiener, D., & Dehm, G. (2008). Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction. Applied Physics Letters, 92(7): 071905. doi:10.1063/1.2884688.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-51F1-2

Abstract

In situ microdiffraction experiments were conducted on focused ion beam machined single crystal Cu pillars oriented for double slip. During deformation, the crystal undergoes lattice rotation on both the primary and critical slip system. In spite of the initial homogeneous microstructure of the Cu pillar, rotation sets in already at yield and is more important at the top of the pillar than at the bottom, demonstrating the inhomogeneous stress state during a microcompression experiment. The rotation results are confirmed by electron backscatter diffraction measurements.