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Atomic and electronic structural studies of VN/MgO (001) interface by an image-side Cs-corrected electron microscope

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Zhang, Z., Rashkova, B., Dehm, G., Lazar, P., Redinger, J., & Podloucky, R. (2009). Atomic and electronic structural studies of VN/MgO (001) interface by an image-side Cs-corrected electron microscope. In G. Kothleitner, & M. Leisch (Eds.), 9th Multinational Microscopy Conference 2009 (pp. 15-16).


Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-532E-A
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