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Journal Article

Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction

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Citation

Kirchlechner, C., Kiener, D., Motz, C., Labat, S., Vaxelaire, N., Perroud, O., et al. (2011). Dislocation storage in single slip-oriented Cu micro-tensile samples: New insights via X-ray microdiffraction. Philosophical Magazine, 91(7-9), 1256-1264. doi:10.1080/14786431003785639.


Cite as: https://hdl.handle.net/11858/00-001M-0000-001A-2549-F
Abstract
Synchrotron X-ray microdiffraction was used to characterize the deformation structure of single crystalline Cu micro-tensile specimens which were oriented for single slip. The 3-mm thick samples were strained in situ in a scanning electron microscope (SEM). Electron microscopy observations revealed glide steps at the surface indicating single slip. While the slip steps at the surface must have formed by the predominant activation of the primary glide system, analysis of Laue peak streaking directions revealed that, even at low strains, dislocations had been activated and stored on an unpredicted slip system. Furthermore, the mLaue scans showed that multiple slip takes over at a later state of deformation.