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Journal Article

In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples

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Citation

Kirchlechner, C., Kečkéš, J., Micha, J.-S., & Dehm, G. (2011). In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples. Advanced Engineering Materials, 13(8), 837-844.


Cite as: http://hdl.handle.net/11858/00-001M-0000-001A-24E3-E
Abstract
mLaue diffraction sheds light onto the deformation behavior of miniaturized samples. Here we present a new instrumental setup for the in situ deformation of micron sized specimens at BM32 of the ESRF synchrotron source. Furthermore, a compression test of a 7mm sized single slip oriented copper pillar is presented, showing the activation of an unpredicted slip system due to misalignment and the formation of several sub-grains. The results of the compressed pillar as well as possibilities and crucial points for measuring and data evaluation are discussed.