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Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

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Vaxelaire, N., Proudhon, H., Labat, S., Kirchlechner, C., Kečkéš, J., Jacques, V., et al. (2010). Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction. New Journal of Physics, 12: 035018, pp. 1-12. doi:10.1088/1367-2630/12/3/035018.


Cite as: http://hdl.handle.net/11858/00-001M-0000-001A-24C1-9
Abstract
Coherent x-ray diffraction is used to investigate the mechanical properties of a single grain within a polycrystalline thin film in situ during a thermal cycle. Both the experimental approach and finite element simulation are described. Coherent diffraction from a single grain has been monitored in situ at different temperatures. This experiment offers unique perspectives for the study of the mechanical properties of nano-objects.