Advances in in-situ testing in scanning electron microscopes: probing 
mechanical properties at the nano/micro-scale

Motz, C.; Kiener, D.; Kirchlechner, C.; Grosinger, W.; Pippan, R.; Dehm, G.

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Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale

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Motz, C., Kiener, D., Kirchlechner, C., Grosinger, W., Pippan, R., & Dehm, G. (2011). Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale. In 10th Multinational Congress on Microscopy (MCM 2011) (pp. 57-58).

Cite as: https://hdl.handle.net/11858/00-001M-0000-001A-23C9-0

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