How to Measure Patent Thickets: A Novel Approach

Von Graevenitz, Georg; Wagner, Stefan; Harhoff, Dietmar

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How to Measure Patent Thickets: A Novel Approach

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http://dx.doi.org/10.1016/j.econlet.2010.12.005
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Von Graevenitz, G., Wagner, S., & Harhoff, D. (2011). How to Measure Patent Thickets: A Novel Approach. Economics Letters, 111(1), 6-9.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-8C63-C

Abstract

This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.