Techniques to prevent sample surface charging and reduce beam damage effects 
for SBEM imaging

Titze, Benjamin

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Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging

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Titze, Benjamin
Department of Biomedical Optics, Max Planck Institute for Medical Research, Max Planck Society;

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Titze, B. (2013). Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging. PhD Thesis, Ruprecht-Karls-Universität Heidelberg, Heidelberg.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0019-8E57-B

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