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Post-Issue Patent Quality Control: A Comparative Study of US Patent Re-Examinations and European Patent Oppositions

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Graham, S. J. H., Hall, B. H., Harhoff, D., & Mowery, D. C. (2003). Post-Issue Patent Quality Control: A Comparative Study of US Patent Re-Examinations and European Patent Oppositions. In W. M. Cohen, & S. A. Merrill (Eds.), Patents in the Knowledge-Based Economy (pp. 74-119). Washington, D. C.: The National Academic Press.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0019-B972-0
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