Electrochemical reductive desorption of alkyl self-assembled monolayers studied 
in situ by spectroscopic ellipsometry: Evidence for formation of a low 
refractive index region after desorption

Kemnade, Nina; Chen, Ying; Muglali, Mutlu Iskender; Erbe, Andreas

doi:10.1039/c4cp01369g

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Electrochemical reductive desorption of alkyl self-assembled monolayers studied in situ by spectroscopic ellipsometry: Evidence for formation of a low refractive index region after desorption

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Kemnade, Nina
Institute of Physical Chemistry, Westfälische Wilhelms-Universität Münster, Corrensstraße 28/30, 48149 Münster, Germany;
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Chen, Ying
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Physik-Department E19, Technische Universität München, James-Franck-Straße 1, 85748 Garching, Germany;

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Muglali, Mutlu Iskender
Atotech Deutschland GmbH, Erasmusstraße, 10553 Berlin;
Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe, Andreas
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kemnade, N., Chen, Y., Muglali, M. I., & Erbe, A. (2014). Electrochemical reductive desorption of alkyl self-assembled monolayers studied in situ by spectroscopic ellipsometry: Evidence for formation of a low refractive index region after desorption. Physical Chemistry Chemical Physics, 16(32), 17081-17090. doi:10.1039/c4cp01369g.

Cite as: https://hdl.handle.net/11858/00-001M-0000-001A-03B0-D

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