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In-plane and out-of-plane defects of graphite bombarded by H, D and He investigated by atomic force and Raman microscopies

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Schiesko,  L.
ITER Technology & Diagnostics (ITED), Max Planck Institute for Plasma Physics, Max Planck Society;

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Pardanaud, C., Martin, C., Cartry, G., Ahmad, A., Schiesko, L., Giacometti, G., et al. (2015). In-plane and out-of-plane defects of graphite bombarded by H, D and He investigated by atomic force and Raman microscopies. Journal of Raman Spectroscopy, 46(2), 256-265. doi:10.1002/jrs.4624.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-C92D-5
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