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Journal Article

Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems


Hu,  Z.
Zhiwei Hu, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Zhu, J., Li, Q., Li, J. X., Ding, Z., Liang, J. H., Xiao, X., et al. (2014). Antiferromagnetic spin reorientation transition in epitaxial NiO/CoO/MgO(001) systems. Physical Review B, 90: 054403, pp. 1-7. doi:10.1103/PhysRevB.90.054403.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0023-CF48-6
The magnetic properties of antiferromagnetic (AFM) spins were investigated using x-ray magnetic linear dichroism (XMLD) in epitaxial NiO/CoO/MgO(001) films as a function of film thickness, temperature, and interface modulation. We found that the NiO AFM spins undergo a spin reorientation transition (SRT) from the in-plane orientation to the out-of-plane orientation at a critical NiO thickness. The NiO AFM SRT can be attributed to the competition between the out-of-plane anisotropy of the NiO AFM spins and the AFM interfacial exchange coupling with the CoO in-plane spins. The NiO SRT thickness increases with the CoO thickness and also with the interfacial coupling strength. The temperature-dependent XMLD measurement indicates that the exchange coupling at the NiO/CoO interface can greatly enhance the Néel temperature of the CoO layer.