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Characterization of InGaAs‐based cameras for astronomical applications using a new VIS‐NIR‐SWIR detector test bench

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Schindler,  Karsten
Department Planets and Comets, Max Planck Institute for Solar System Research, Max Planck Society;
IMPRS on Physical Processes in the Solar System and Beyond, Max Planck Institute for Solar System Research, Max Planck Society;

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Schindler, K., Wolf, J., & Krabbe, A. (2014). Characterization of InGaAs‐based cameras for astronomical applications using a new VIS‐NIR‐SWIR detector test bench. Proceedings of the SPIE, 9145, 91450X‐91450X‐13.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0023-D19C-6
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