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Conference Paper

Measurement of the angular distribution of Dielectronic Recombination into highly charged Krypton ions

MPS-Authors
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Beilmann,  Christian
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Bernitt,  Sven
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Crespo López-Urrutia,  José R.
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Rudolph,  Jan K.
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Steinbrügge,  René Friedrich
Division Prof. Dr. Thomas Pfeifer, MPI for Nuclear Physics, Max Planck Society;

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Citation

Amaro, P., Shah, C., Tashenov, S., Beilmann, C., Bernitt, S., Crespo López-Urrutia, J. R., et al. (2014). Measurement of the angular distribution of Dielectronic Recombination into highly charged Krypton ions. Journal of Physics: Conference Series, 488: 062030. doi:10.1088/1742-6596/488/6/062030.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0023-D7B4-4
Abstract
Angular distribution of x-rays emitted in the process of Dielectronic Recombination (DR) was studied at the Electron Beam Ion Trap. For this the photon emission spectra were observed along and perpendicular the electron beam propagation direction. X-ray line intensities dier drastically between the two acquired spectra. This indicates a strong alignment of the total angular momentum vector of the excited states populated by DR with respect to the electron beam propagation direction.