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A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon

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Stoffers,  Andreas
Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin,  Oana
Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Stoffers, A., Cojocaru-Mirédin, O., Seifert, W., Zaefferer, S., & Raabe, D. (2014). A correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon. Talk presented at Atom Probe Tomography & Microscopy 2014. Stuttgart, Germany. 2014-08-31 - 2014-09-05.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0023-DC85-4
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