English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Indication of Te segregation in laser-irradiated ZnTe observed by in situ coherent-phonon spectroscopy

MPS-Authors
/persons/resource/persons22112

Shimada,  Toru
Physical Chemistry, Fritz Haber Institute, Max Planck Society;
Hirosaki University;

/persons/resource/persons32623

Kamaraju,  Natarajan
Physical Chemistry, Fritz Haber Institute, Max Planck Society;
Los Alamos National Laboratory, Center for Integrated Nanotechnologies;

/persons/resource/persons22250

Wolf,  Martin
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons21693

Kampfrath,  Tobias
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Shimada, T., Kamaraju, N., Frischkorn, C., Wolf, M., & Kampfrath, T. (2014). Indication of Te segregation in laser-irradiated ZnTe observed by in situ coherent-phonon spectroscopy. Applied Physics Letters, 105(11): 111908. doi:10.1063/1.4896039.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0023-D7C8-7
Abstract
We irradiate a ZnTe single crystal with 10-fs laser pulses at a repetition rate of 80 MHz and investigate its resulting gradual modification by means of coherent-phonon spectroscopy. We observe the emergence of a phonon mode at about 3.6 THz whose amplitude and lifetime grow monotonously with irradiation time. The speed of this process depends sensitively on the pump-pulse duration. Our observations strongly indicate that the emerging phonon mode arises from a Te phase induced by multiphoton absorption of incident laser pulses. A potential application of our findings is laser-machining of microstructures in the bulk of a ZnTe crystal, a highly relevant electrooptic material.