The applicability of far-infrared fine-structure lines as star formation rate 
tracers over wide ranges of metallicities and galaxy types

De Looze, Ilse; Cormier, Diane; Lebouteiller, Vianney; Madden, Suzanne; Baes, Maarten; Bendo, George J.; Boquien, Médéric; Boselli, Alessandro; Clements, David L.; Cortese, Luca; Cooray, Asantha; Galametz, Maud; Galliano, Frédéric; Graciá-Carpio, Javier; Isaak, Kate; Karczewski, Oskar Ł.; Parkin, Tara J.; Pellegrini, Eric W.; Rémy-Ruyer, Aurélie; Spinoglio, Luigi; Smith, Matthew W. L.; Sturm, Eckhard

doi:10.1051/0004-6361/201322489

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The applicability of far-infrared fine-structure lines as star formation rate tracers over wide ranges of metallicities and galaxy types

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Graciá-Carpio, Javier
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Sturm, Eckhard
Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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De Looze, I., Cormier, D., Lebouteiller, V., Madden, S., Baes, M., Bendo, G. J., et al. (2014). The applicability of far-infrared fine-structure lines as star formation rate tracers over wide ranges of metallicities and galaxy types. Astronomy & Astrophysics, 568: A62. doi:10.1051/0004-6361/201322489.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0023-FCB4-5

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