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FTIR Microscopy with Polarized Radiation for the Analysis of Adsorption Processes in Molecular Sieves

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Schüth,  F.
Institut für Anorganische Chemie und Analytische Chemie der Johannes Gutenberg-Universität Mainz;
Research Department Schüth, Max-Planck-Institut für Kohlenforschung, Max Planck Society;

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Demuth,  D.
Institut für Anorganische Chemie und Analytische Chemie der Johannes Gutenberg-Universität Mainz;
Research Department Schüth, Max-Planck-Institut für Kohlenforschung, Max Planck Society;

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Citation

Schüth, F., Demuth, D., & Kallus, S. (1994). FTIR Microscopy with Polarized Radiation for the Analysis of Adsorption Processes in Molecular Sieves. In Studies in Surface Science and Catalysis (pp. 1223-1229). Amsterdam: Elsevier. doi:10.1016/S0167-2991(08)63661-7.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-4B47-B
Abstract
FTIR Microscopy with polarized light was used to study the orientation of different molecules in Silicalite I, SAPO-5 and AlPO4-5 molecular sieves during the adsorption process and in their equilibrium positions. While the uptake and the equilibrium positions of p-xylene are essentially not influenced by the the framework charge, large differences between AlPO4-5 and SAPO-5 are observed with the strongly basic p-nitroaniline molecule.