Separating strain from composition in unit cell parameter maps obtained from 
aberration corrected high resolution transmission electron microscopy imaging

Schulz, T.; Duff, Andrew; Remmele, M.; Korytov, T.; Markut, M.; Albrecht, Martin; Lymperakis, Liverios; Neugebauer, Jörg; Chèze, C.; Skierbiszewski, C.

doi:10.1063/1.4862736

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Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging

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Duff, Andrew
Microstructure, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Lymperakis, Liverios
Microstructure, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Neugebauer, Jörg
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schulz, T., Duff, A., Remmele, M., Korytov, T., Markut, M., Albrecht, M., et al. (2014). Separating strain from composition in unit cell parameter maps obtained from aberration corrected high resolution transmission electron microscopy imaging. Journal of Applied Physics, 115(3): 033113. doi:10.1063/1.4862736.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-A942-2

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