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Journal Article

A lifespan comparison of the reliability, test-retest stability and signal-to-noise ratio of event-related potentials assessed during performance monitoring

MPS-Authors
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Hämmerer,  Dorothea
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Li,  Shu-Chen
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Voelkle,  Manuel C.
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Müller,  Viktor
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Lindenberger,  Ulman
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Fulltext (public)

DH_Lifespan_2013.pdf
(Publisher version), 520KB

Supplementary Material (public)
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Citation

Hämmerer, D., Li, S.-C., Voelkle, M. C., Müller, V., & Lindenberger, U. (2013). A lifespan comparison of the reliability, test-retest stability and signal-to-noise ratio of event-related potentials assessed during performance monitoring. Psychophysiology, 50(1), 111-123. doi:10.1111/j.1469-8986.2012.01476.x.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0024-EA72-C
Abstract
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