A lifespan comparison of the reliability, test-retest stability and 
signal-to-noise ratio of event-related potentials assessed during performance 
monitoring

Hämmerer, Dorothea; Li, Shu-Chen; Voelkle, Manuel C.; Müller, Viktor; Lindenberger, Ulman

doi:10.1111/j.1469-8986.2012.01476.x

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A lifespan comparison of the reliability, test-retest stability and signal-to-noise ratio of event-related potentials assessed during performance monitoring

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Hämmerer, Dorothea
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Li, Shu-Chen
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Voelkle, Manuel C.
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Müller, Viktor
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

/persons/resource/persons139635

Lindenberger, Ulman
Center for Lifespan Psychology, Max Planck Institute for Human Development, Max Planck Society;

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Citation

Hämmerer, D., Li, S.-C., Voelkle, M. C., Müller, V., & Lindenberger, U. (2013). A lifespan comparison of the reliability, test-retest stability and signal-to-noise ratio of event-related potentials assessed during performance monitoring. Psychophysiology, 50(1), 111-123. doi:10.1111/j.1469-8986.2012.01476.x.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-EA72-C

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