Domain wall pinning in ultra-narrow electromigrated break junctions

Reeve, R. M.; Loescher, A.; Mawass, M.-A.; Hoffmann-Vogel, R.; Kläui, M.

doi:10.1088/0953-8984/26/47/474207

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Domain wall pinning in ultra-narrow electromigrated break junctions

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Mawass, M.-A.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Reeve, R. M., Loescher, A., Mawass, M.-A., Hoffmann-Vogel, R., & Kläui, M. (2014). Domain wall pinning in ultra-narrow electromigrated break junctions. Journal of Physics: Condensed Matter, 26(47): 474207. doi:10.1088/0953-8984/26/47/474207.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0025-7B1F-4

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