Reply to a comment of J. Zemek, Prague, regarding the paper "resolving the 
depth coordinate in photoelectron spectroscopy - comparison of excitation 
energy variation vs. angular-resolved XPS for the analysis of a self-assembled 
monolayer model system" Discussion

Merzlikin, Sergiy Vasil´ović; Tolkachev, Nikolay N.; Strunskus, Thomas; Witte, Gregor; Glogowski, Thomas; Wöll, Christof H.; Grünert, Wolfgang

doi:10.1016/j.susc.2008.10.001

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Reply to a comment of J. Zemek, Prague, regarding the paper "resolving the depth coordinate in photoelectron spectroscopy - comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system" Discussion

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Merzlikin, S. V., Tolkachev, N. N., Strunskus, T., Witte, G., Glogowski, T., Wöll, C. H., et al. (2008). Reply to a comment of J. Zemek, Prague, regarding the paper "resolving the depth coordinate in photoelectron spectroscopy - comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system" Discussion. Surface Science, 602(23), 3634-3635. doi:10.1016/j.susc.2008.10.001.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0025-0848-8

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