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Quantitative photoemission depth profiling - A new approach to the surface analysis of real materials

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Merzlikin, S. V. (2006). Quantitative photoemission depth profiling - A new approach to the surface analysis of real materials. Poster presented at 5. Materialwissenschaftlicher Tag in RUB, Bochum, Germany.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0025-087B-5
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