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Measuring Patent Thickets

MPS-Authors
/persons/resource/persons130171

Harhoff,  Dietmar
MPI for Innovation and Competition, Max Planck Society;

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Pötzl,  Matthias
MPI for Innovation and Competition, Max Planck Society;

/persons/resource/persons130186

Natterer,  Michael
MPI for Innovation and Competition, Max Planck Society;

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Citation

Harhoff, D., Wagner, S., Pötzl, M., Natterer, M., & Graevenitz, G. v. (2014). Measuring Patent Thickets.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0025-A86E-9
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