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Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn-Ga films

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ViolBarbosa,  Carlos E.
Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Ouardi,  Siham
Siham Ouardi, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Fecher,  Gerhard H.
Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Felser,  Claudia
Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Citation

ViolBarbosa, C. E., Ouardi, S., Kubota, T., Mizukami, S., Fecher, G. H., Miyazaki, T., et al. (2015). Forward scattering in hard X-ray photoelectron spectroscopy: Structural investigation of buried Mn-Ga films. Applied Physics Letters, 106(5): 052402, pp. 1-5. doi:10.1063/1.4907537.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0025-AF64-1
Abstract
X-ray photoelectron diffraction (XPD) in combination with hard X-ray photoelectron spectroscopy (HAXPES) has been used to study the structure of buried layers in thin multilayer films. A detailed layer-by-layer investigation was performed using the element-specific, local-probe character of XPD. In the present work, angular-resolved HAXPES at a photon energy of 7.94 keV photon energy was used to investigate a Cr/Mn62Ga38/Mg/MgO multilayer system. Differences in the angular distributions of electrons emitted from Mn and Ga atoms revealed that the structure of Mn62Ga38 changes from L1(0) towards D0(22) for increasing annealing temperatures. A c/a ratio of 1.81+/-0.06 was determined for the buried Mn62Ga38 layer in a D0(22) structure from the XPD experiment. The improvement of the structural order of the Mn62Ga38 layer is accompanied by an improvement of the structure of the overlying MgO layer. (C) 2015 AIP Publishing LLC.