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Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids

MPS-Authors
/persons/resource/persons145797

Ochmann,  Miguel
Institute for Nanostructure and Solid State Physics, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany;
Ultrafast Molecular Dynamics, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Center for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany;

/persons/resource/persons15260

Huse,  Nils
Ultrafast Molecular Dynamics, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Institute for Nanostructure and Solid State Physics, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany;
Center for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg, Germany;

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Fulltext (public)

1.4907949.pdf
(Publisher version), 966KB

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Citation

Eckert, S., Beye, M., Pietzsch, A., Quevedo, W., Hantschmann, M., Ochmann, M., et al. (2015). Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids. Applied Physics Letters, 106(6): 061104. doi:10.1063/1.4907949.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0026-A155-A
Abstract
The discovery of ultrafast X-ray induced optical reflectivity changes enabled the development of X-ray/optical cross correlation techniques at X-ray free electron lasers worldwide. We have now linked through experiment and theory the fundamental excitation and relaxation steps with the transient optical properties in finite solid samples. Therefore, we gain a thorough interpretation and an optimized detection scheme of X-ray induced changes to the refractive index and the X-ray/optical cross correlation response.