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Joint crystallographic and chemical characterization at the nanometer scale by correlative TEM and atom probe tomography

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Herbig,  Michael
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Li,  Yujiao
Alloy Design and Thermomechanical Processing, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Choi,  Pyuck-Pa
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Goto,  Shoji
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Herbig, M., Raabe, D., Li, Y., Choi, P.-P., Zaefferer, S., & Goto, S. (2014). Joint crystallographic and chemical characterization at the nanometer scale by correlative TEM and atom probe tomography. Talk presented at Workshop: White-etching layers in ball and roller bearings, Informatik-Zentrum Hörn. Aachen, Germany. 2014-11-18.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-A482-A
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