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In-situ stress measurements in Cu films using synchrotron radiation

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/persons/resource/persons125273

Marx,  Vera Maria
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons125219

Kirchlechner,  Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons75388

Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Marx, V. M., Kirchlechner, C., Berger, J., Cordill, M. J., & Dehm, G. (2014). In-situ stress measurements in Cu films using synchrotron radiation. Talk presented at "Mechanical Issues for Flexible Electronics" Flex Workshop, Erich Schmid Institut, Leoben. Leoben, Austria. 2014-04-10 - 2014-04-11.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0024-A2A2-F
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